F04200 - SEMI F42 - Test Method for Semiconductor Processing Equipment Voltage Sag Immunity StdTpc-Lead Finishes This Test Method is sensitive

This Test Method is sensitive to the following ionic species:

本文書の目的は，半導体製造装置（SME）に関し，サプライヤ施設における最終組立と梱包，輸送，ユーザのクリーンルームの製造領域への移送と開梱に特有な活動のための標準ガイドラインを確立することである。

Standard events that document recipe execution in the process module or process area guarantee the availability of such context information

The scope of this study does not extend to recommendations as to which techniques may be less or more appropriate for particular manufacturing processes

X-Fab Silicon Foundries

F04200 - SEMI F42 - Test Method for Semiconductor Processing Equipment Voltage Sag Immunity StdTpc-Lead Finishes This Test Method is sensitiveNOTICE: This Document is no longer supported by the global technical committee. It has been replaced by SEMI F47. The purpose of this Document is to define the test method used to characterize the susceptibility of semiconductor processing, metrology, and automated test equipment to voltage sags. This Document defines the testing procedures and test equipment required to characterize the susceptibility of equipment to voltage sags by showing voltage