Pay in 4 interest-free payments of $48.25 Learn more
Ships within 48 hours · Estimated delivery Aug 27 - Sep 1
SEMI F15-0308 (Withdrawn 1011)
SEMI C27-0708 (technical revision)
and is limited to silicon with doping concentrations less than about 1 × 1017 atoms/cm3
89 mm wall (1/4 in
Analysis of the surface or surface near regions of samples may be performed according to the test method by additional sample preparation and avoiding carefully surface contamination during sample extraction
E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current SEMI F15-0308 (Withdrawn 1011)This Specification describes a data and event sharing and streaming methodology for semiconductor test and related operations. The scheme fully supports legacy equipment and allows equipment vendors the flexibility to provide additional data items via extensions. Real time, historical, and widely distributed data are fully supported. Provenance of all data is supported via customizable metadata along with cryptographic hashing and signing.
US$ 1100.40
US$ 747.60
US$ 1054.21
US$ 11.00
