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SEMI E92-0999 (first published)
6 These test methods measure diffusion lengths at room temperature (22°C) only
This Standard can apply to rectangle shapes
SEMI E37-0308 (Reapproved 0708)
it gives the required characteristics of the thickness data array
G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages StdTier-Tier0 SEMI E92-0999 (first published)This Test Method describes the measurement method for the inductance of internal traces of semiconductor packages. This Test Method is applicable for the measurement of package inductance that is greater than 0. 5 nH. This Test Method describes the measurement of a pin grid array, one of the package types, as a sample. This Test Method is also applicable to other types of packages. The inductance in this Standard is limited to that of internal traces
