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E16300 - SEMI E163 - Guide for the Handling of Reticles and Other Extremely Electrostatic Sensitive (EES) Items Within Specially Designated Areas Revision:SEMI E163-0212 - Superseded it focuses in its scope

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it focuses in its scope to a small set of requirements which are common to all FPUs

SEMI G42 — Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages

2  Final assemblies should be evaluated according to the criteria of SEMI S2 for environmental

Tungsten hexafluoride is a colorless gas or colorless liquid

The purpose of this Document is to provide specifications for silane (SiH4) that is used in the semiconductor industry

E16300 - SEMI E163 - Guide for the Handling of Reticles and Other Extremely Electrostatic Sensitive (EES) Items Within Specially Designated Areas Revision:SEMI E163-0212 - Superseded it focuses in its scopeThe purpose of this Document is to minimize the negative impact on productivity caused by static charge and electric fields in semiconductor manufacturing equipment and facilities. It is a Guide for establishing optimum electrostatic compatibility of the handling environment for reticles and other items that are extremely electrostatic sensitive (EES) to electrostatic charge, voltage, and electric field. This Guide is complementary to SEMI E78 and

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