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1-0703 (technical revision)
SEMI D65-0719 (Reapproved 0925)
それぞれの方法は，管理された連続化学反応の間に基板より除去された材料の合計の量を，提供する。それぞれの方法に対し，この結果は名目上同一である。
The Typical Facilities Services and Termination Matrix Example—United States (refer to Table 1) identifies utilities
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D04700 - SEMI D47 - Test Method for Measurement of Bent Cold Cathode Flourescent Lamps Revision:SEMI D47-0307 - Inactive 1-0703 (technical revision)This standard was technically approved by the global Flat Panel Display Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on November 21, 2006. It was available at www. semi. org in February 2007. The purpose of this document is to standardize the method for measurement of electrical and optical characteristics of bent cold cathode fluorescent lamp (CCFL). Referenced SEMI Standards SEMI D35 Test Method
