MF039800 - SEMI MF398 - Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum StdPbc-1112 This Specification covers reclaim wafers

This Specification covers reclaim wafers that are either customer-supplied or third party-sourced

Basic Test System Requirements — This Standard states the basic vibration test system requirements

it is always possible that the test could yield a faulty result through some unforeseen defect in the analytical equipment

装置とロードポート群のアクセスモードの切り替え

1-0308 — 直径50

MF039800 - SEMI MF398 - Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum StdPbc-1112 This Specification covers reclaim wafersThis standard was technically approved by the global Silicon Wafer Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on November 21, 2006. It was available at www. semi. org in February 2007. Originally published by ASTM International as ASTM F398 74T; previously published as SEMI MF398 92 (Reapproved 2002) NOTICE: This document was balloted and approved for withdrawal in 2007. This test method covers