HB00800 - SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal Revision:SEMI HB8-0217 - Inactive orgで入手可能となる。初版は1988年発行。

orgで入手可能となる。初版は1988年発行。

1-1106 (technical revision)

5  Because carrier lifetime is directly influenced by the presence of metallic impurity contamination

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SEMI A2 — Specification for Surface Mount Assembler Smart Hookup (SMASH)

HB00800 - SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal Revision:SEMI HB8-0217 - Inactive orgで入手可能となる。初版は1988年発行。NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. The purpose of this Standard is to standardize a test method for sapphire single crystal orientation measurement which includes sapphire cylinder, sapphire ingot, sapphire wafer, etc. It will improve the standardization of