M05700 - SEMI M57 - シリコンアニールウェーハの仕様 Revision:SEMI M57-1011 - Superseded This Test Method is reproducible

This Test Method is reproducible and provides a metric (CPT) in addition to a qualitative (visual) evaluation of corrosion resistance

本文書の目的は，トランス1，2ジクロロエチレンに対して要求が認められたグレードのガイドラインを示す。

This Specification is intended to address the needs of the 3D Stacked IC (3DS-IC) industry by providing the tools needed to procure glass carrier wafers to be used in a 3DS-IC process

§ 10 and Appendix 2 provide methods to determine reliability growth and degradation

When utilities implement measures to increase power system reliability

M05700 - SEMI M57 - シリコンアニールウェーハの仕様 Revision:SEMI M57-1011 - Superseded This Test Method is reproducibleglobal Silicon Wafer Committee201323global Audits and Reviews Subcommittee20134www. semiviews. org www. semi. org20047201110 180 nm130 nm90 nm( R1 1), 65 nm, 45 nm, 32 nm, ( R1 2), 22 nm ( R1 3) crystal originated particlesCOPdenuded zoneDZ Referenced SEMI Standards SEMI M1 Specifications for Polished Single Crystal Silicon Wafers SEMI M35 Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection SEMI M45