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3D00100 - SEMI 3D1 - Terminology for Through Silicon via Geometrical Metrology StdTpc-Fluorocarbon Components この安全ガイドラインは,そのようなデバイスを流れる数種類のガスおよびその混合物の近似最大および最小流量を計算する方法を提供する。

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この安全ガイドラインは,そのようなデバイスを流れる数種類のガスおよびその混合物の近似最大および最小流量を計算する方法を提供する。

and similar written communication relating to equipment

SEMI D64-0811 (first published)

nor does it make recommendations regarding decisions about the process cycle or equipment used to produce the thin film that was measured

SEMI E5-88 (technical revision)

3D00100 - SEMI 3D1 - Terminology for Through Silicon via Geometrical Metrology StdTpc-Fluorocarbon Components この安全ガイドラインは,そのようなデバイスを流れる数種類のガスおよびその混合物の近似最大および最小流量を計算する方法を提供する。Clear and commonly accepted definitions are needed for efficient communication and to prevent misunderstanding between buyers and vendors of metrology equipment and manufacturing services. The purpose of this Document is to provide a consistent terminology for the understanding and discussion of metrology issues important to through silicon vias (TSV). The scope of this Document is limited to the definitions of terms used to specify measured

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