G00500 - SEMI G5 - Standard for Ceramic Chip Carriers StdTpc-Scanning Surface Inspection Systems higher performance interconnects

higher performance interconnects

automated delivery of actual mask results and qualification data by mask shops and to allow the automatic processing of such data by mask customers

This Standard defines the test method for determining the aspect ratio of solar cell metal finger

Only the ability to describe the fact that a supplier has implemented such a concept and that a client can discover this implementation and any data it can produce is in scope for this Specification

5-0298 (technical revision)

G00500 - SEMI G5 - Standard for Ceramic Chip Carriers StdTpc-Scanning Surface Inspection Systems higher performance interconnectsNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This Specification defines the acceptance criteria for co fired, ceramic chip carriers both leaded and lead less. Referenced SEMI Standards (purchase separately) SEMI G8 Test Method for Gold Plating Quality SEMI G25 Test