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1，SEMI P5
表記法を一貫させるための共通データ構造のタイプ定義を提供する。
4 The Guide focuses on general measurement techniques including infrared (IR) laser profiling
Measurements are made at the center of the wafer using a single-configuration of the four-point probe
Alternatively closed vessel thermal conduction heating may also be applied
D08100 - SEMI D81 - Test Method for Dimming Properties of Flat Panel Displays StdTpc-Package Specifications 1，SEMI P5The performance of the dimming technology affects the image quality of the display. Even though there are several measuring methods for display luminance, they are not enough to represent the luminance of small sizes are formed less than 10% of the active area. The new measurement methods propose to measure the luminance characteristics of dimming technology that operates according to the signal from small sizes. This Standard is applicable to the
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