P01400 - SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定 StdPbc-E03501 Each process module will typically

Each process module will typically have a different set of context and process data parameter values

5-0211 (Reapproved 0623) — Specification for Round 100 mm Polished Monocrystalline Indium Phosphide Wafers for Electronic and Optoelectronic Device Applications (V-Groove Option)

Tests are done at supplier recommended flow rate

facility distribution

The purpose of this Specification is to standardize requirements for n-butyl acetate used in the semiconductor industry and to document testing procedures to support those specifications

P01400 - SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定 StdPbc-E03501 Each process module will typicallyNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. 1: