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1-0703 (first published)
This specification defines the physical requirements for preforms made with thermosetting molding compounds
the desired spatial resolution of the measurement instrument
SEMI M62-0514 (technical revision)
previously published March 2009
PV06700 - SEMI PV67 - Test Method for the Etch Rate of a Crystalline Silicon Wafer by Determining the Weight Loss StdTpc-Anti-Counterfeiting 1-0703 (first published)The purpose of this Standard is to standardize a fast and accurate test method for the etch rate of a crystalline silicon wafer by determining the weight loss. This Standard specifies the test method of crystalline silicon wafer etch, edge isolation etch, polishing and other corrosion rate. This Standard applies to the testing of etch rate in the process of making cells. This Standard specifies the corrosion time. Referenced SEMI Standards (purchase
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