G09300 - SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法 StdPbc-0825 other test methods are required

other test methods are required to cover the measurement of minority carrier diffusion lengths in specimens of extrinsic single-crystal semiconducting materials or in homoepitaxial layers of known resistivity deposited on more heavily doped substrates of the same type

The metrology industry is building tools that will measure and map surface features at nanotopography amplitudes and spatial wavelengths

depth profile of epitaxial layers by electrochemical capacitance voltage (ECV) profiling

Specific equations for calculating flow coefficients

2  A specification of the material quality of SI GaAs substrates includes a number of the parameters described below

G09300 - SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法 StdPbc-0825 other test methods are requiredglobal Assembly & Packaging Technical Committee2012221global Audits and Reviews Subcommittee20124www. semiviews. org www. semi. org BGA Referenced SEMI Standards None.