Pay in 4 interest-free payments of $48.25 Learn more
Ships within 48 hours · Estimated delivery Aug 14 - Aug 19
E This standard was editorially modified in September 2008 to correct an error
plastic substrates
4 This Guide is designed to provide definitions for describing a more suitable measurement strategy for low stiffness wafers and geometries
This Document lists the proposed impurity limits of boron tribromide for a grade used in the semiconductor industry
This Document is to provide a test sequence for determining the counting efficiency of liquid-borne particle counters for which the minimum detectable particle size is between 30 nm and 100 nm
D03600 - SEMI D36 - 液晶顯示器背光模組的專用術語 Revision:SEMI D36-0306 - Inactive E This standard was editorially2005112920062www. semi. org200311 NOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. 2006 NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and
US$ 199.00
US$ 197.00
US$ 193.00
US$ 261.50
US$ 50.00
US$ 180.50
US$ 104.50
US$ 158.00
US$ 151.00
US$ 121.00
US$ 429.50
US$ 16.00
US$ 374.50
