T01300 - SEMI T13 - Specification for Device Tracking: Concepts, Behavior, and Services Revision:SEMI T13-1104 - Superseded including the metal impurity collection

including the metal impurity collection method from a silicon wafer surface

For each metric presented

NOTICE: This document was completely rewritten in 2003

キャリアIDリーダ／ライタ機能スタンダード作業の目的はキャリアIDリーダおよびキャリアIDリーダ／ライタが上位コントローラに提供するコンセプト，挙動，およびサービス（機能）に関する共通仕様を提供することである。スタンダードインタフェースはキャリアIDリーダ／ライタの互換性を上げるので，ユーザおよび装置サプライヤの選択の範囲が広がることになる。

Recent failure-rate analysis indicates that a large portion of the accelerated PV module qualification failures are related to the failure of the package itself

T01300 - SEMI T13 - Specification for Device Tracking: Concepts, Behavior, and Services Revision:SEMI T13-1104 - Superseded including the metal impurity collectionThis standard was technically approved by the global Traceability Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on April 30, 2010. Initially available at www. semi. org in June 2010. Originally published June 2004; previously published November 2004. The purpose of this specification is to trace devices for the sake of quality control, warranty, security or any other reasons. This specification makes