G08000 - SEMI G80 - 自動試験装置の総合的デジタルタイミング精度を分析するための試験方法 StdVol-Process Chemicals 2 All three test methods

2  All three test methods covered are nondestructive

and small outline package (SOP) leadframe strips

SEMI M61-0612 (Reapproved 0319)

SEMI G92-1113 (technical revision)

SEMI HB4-0913 (first published)

G08000 - SEMI G80 - 自動試験装置の総合的デジタルタイミング精度を分析するための試験方法 StdVol-Process Chemicals 2 All three test methodsNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI CurrentInactiveInactiveSEMI ICATEAC ATEATEATE ATE Referenced SEMI Standards (purchase separately) SEMI G79 Specification for Overall Digital Timing Accuracy