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This correlation should include sample size as well as device geometry
4-points resistivity probes
and 150 mm diameter wafers
the XML represents the content
view angles
MF176300 - SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer Revision:SEMI MF1763-0318 - Superseded This correlation should include samplePolarizer contrast is important in polarimetry systems, ellipsometers, optical modulators, shutters, and target signature discrimination based on polarized radiation. This Test Method covers measurement of polarizer contrast. It provides procedures suitable for use in service evaluation, manufacturing control, or for research and development purposes. They are not recommended for use in acceptance testing until their precision has been evaluated by
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