G03300 - SEMI G33 - Specification for Pressed Ceramic Pin Grid Array Packages Revision:Default Title and extending into the base

and extending into the base metal

Analysis of the measured thermal emission rate in the depletion layer of a test device as a function of temperature leads to activation energies and effective capture cross sections of the defects present

orgで入手可能となる。初版は1995年発行。前版は2002年3月発行。

The nominal volume of the canister which is over 40 liters is exempted from the scope

1  In this Standard

G03300 - SEMI G33 - Specification for Pressed Ceramic Pin Grid Array Packages Revision:Default Title and extending into the baseThis specification defines the acceptance criteria for ceramic pin grid array packages produced utilizing pressed ceramic, mechanically inserted pins and solder for electrical interconnection of pins. Referenced SEMI Standards None.