P04500 - SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様 Revision:SEMI P45-0708 - Superseded this Standard provides:

Name: P04500 - SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様 Revision:SEMI P45-0708 - Superseded this Standard provides:
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SKU: 575693159

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Description

this Standard provides:

SEMI S26-0709 (technical revision)

This Standard specifies the measurement method of polarizing films and other films for FPD by using contour matching method

SEMI D74-0116 (first published)

SEMI MF723-0706 (technical revision)

P04500 - SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様 Revision:SEMI P45-0708 - Superseded this Standard provides:global Micropatterning Committee2008513global Audits and Reviews Subcommittee20086www. semi. org20087CD ROM20063 MALY Referenced SEMI Standards SEMI P39 OASISTM Open Artwork System Interchange Standard SEMI P44 Specification for Open Artwork System Interchange Standard (OASISTM) Specific to Mask Tools

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