PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock Revision:SEMI PV50-0114 (Reapproved 1220) - Current This method applies to all

This method applies to all facilities that perform mechanical measurements on leadframes

The purpose of this Document is to standardize requirements for phosphoric etchants used in the semiconductor industry and testing procedures to support those standards

Refer to Related Information 2 for reference

1-1104 (first published)

SEMI verifies this information by making up to 50 inquiries a week and periodic visits to semiconductor companies

PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock Revision:SEMI PV50-0114 (Reapproved 1220) - Current This method applies to allThis Specification is intended for the quality and the testing method of polyethylene (PE) bags. The quality of PE bags is critical as poor quality PE bags may contaminate polysilicon and cause contamination during transportation. Forming an industry consensus standard will minimize contamination, control the associated costs and improve communication between supplier and user. This Standard will cover the quality criteria and the associated test