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For instance
装置設計においては，ユーザ集団に対し予測できる体型，体力，動作の特質の範囲に合わせたものとし，疲労および傷害を最小化する設計にすべきである。このような設計は，作業実行を容易にする。
This Specification covers requirements for silicon on insulator (SOI) for semiconductor power-device/IC manufacture
that can be used by all Standards defining public objects
SEMI D19 — Test Method for Chemical Resistance of FPD Color Filter
T01700 - SEMI T17 - Specification of Substrate Traceability Revision:SEMI T17-0706 (Reapproved 0923) - Current For instanceThe purpose of this Specification is to provide standard data representation and its communication of Die Trace Data for SEMI T13 Device Tracking Standard especially for substrate traceability. The final goal of this Standard is to realize the traceability of semiconductor, flat panel display (FPD), or MEMS devices as described in SEMI T13. This Standard clarifies a part of the traceability specific for substrate such as wafer or some other substrates
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