PV07400 - SEMI PV74 - Test Method for the Measurement of Chlorine in Silicon by Ion Chromatography Revision:SEMI PV74-0216 - Superseded Any experimental parameter is a

Any experimental parameter is a possible variable

本基準係針對半導體與平面顯示器產業之過氧化氫貯存、處理設備及系統設定最低的安全與衛生標準。

semiconductor monosilicon and semiconductor polysilicon

this TDDB test method has a higher sensitivity for detecting the accidental breakdown (B mode) than TZDB

This Standard was technically approved by the Photovoltaic – Materials Global Technical Committee

PV07400 - SEMI PV74 - Test Method for the Measurement of Chlorine in Silicon by Ion Chromatography Revision:SEMI PV74-0216 - Superseded Any experimental parameter is aThe quality of polysilicon is very important for the user. More and more granular silicon is being produced and used to produce polysilicon for use in the photovoltaic industry. Research shows that more chlorine remains in granular silicon than in chunk silicon. Chlorine remaining in the silicon affects the quality. Thus, it is necessary to develop a method to measure the chlorine in silicon. This Test Method can facilitate unification of protocols