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D08600 - SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays StdPbc-0318 and repair their equipment

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Description

and repair their equipment

This pattern then appears as a mark on the individual wafers outside of the active area of solar cells after the brick is sliced

and date of session

The intent of this Document is not to suggest any specific testing program but to specify the test method to be used when testing for parameters that are covered by this method

and granules

D08600 - SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays StdPbc-0318 and repair their equipmentThis Test Method aims to elucidate the measures of flicker nuisance from playing motion pictures on wide visual field displays, such as large size curved displays, near eye displays or flexible displays etc. The Test Method proposes an objective detection algorithm and presents resultant examples on assessing flickering light from display applications. Finally, the Test Method reveals that the 90th percentile of magnitude spectrum is a proper measure

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