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3 These tests require that the deposition system employ a DMA (or an equivalent programmable filtering system) to accomplish both peak diameter determination and narrowing of particle source distributions (refer to Related Information 1)
a definition of the wafer transport plane within cassette and process modules is required
This Standard will be helpful to unify methodologies measurement used for electro-optical and mechanical characteristics which can be used to improve the quality of integrated LED backlight units and track conformity to original design rules
· Transfer of general-purpose data between the host and equipment
專門用語
D04600 - SEMI D46 - 平面顯示器偏光膜的專用術語 StdPbc-1111 3 These tests require that1. 1 FPD 2. 1 This standard was technically approved by the global Flat Panel Display Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on May 16, 2006. It was available at www. semi. org in June 2006. In this standard, definition and interpretation of each term provides material characteristics used for Flat Panel Display (FPD) manufacturing. This standard benefits unification of terminologies generally
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