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The wafer bonding technique used was oxide bonding
the depolarization effect of color filters is obtained by measuring the reduction in polarization efficiency when polarized light passes through color filters
SEMI M31-1104 (technical revision)
It is unnecessary
total oxidizable carbon (TOC) analysis
PV06600 - SEMI PV66 - Test Method for Determining the Aspect Ratio of Solar Cell Metal Fingers by Confocal Laser Scanning Microscope Revision:SEMI PV66-0715 - Superseded The wafer bonding technique usedThe purpose of this Standard is to standardize a fast and accurate test method for determining the aspect ratio of solar cell metal fingers by confocal laser scanning microscope (CLSM). This Standard defines the test method for determining the aspect ratio of solar cell metal finger. This Standard applies to test the aspect ratio of solar cell metal finger by CLSM. Referenced SEMI Standards (purchase separately) None. Revision History SEMI PV66 0715
