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F08000 - SEMI F80 - Test Method for Determination of Gas Change/Purge Efficiency of Gas Delivery System Revision:SEMI F80-1103 - Superseded org in October 2005

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org in October 2005

oxygen plasma may be used separately or in conjunction with these techniques

SEMI E78-0708 (technical revision)

SEMI E43-0813 (technical revision)

SEMI E111-1101 (first published)

F08000 - SEMI F80 - Test Method for Determination of Gas Change/Purge Efficiency of Gas Delivery System Revision:SEMI F80-1103 - Superseded org in October 2005This Document is a guide to a test method to determine gas change purge efficiency of gas delivery system. It covers both conventional metal face sealing and surface mount gas delivery systems. This Test Method applies to all type of high purity gas delivery systems used in semiconductor manufacturing facilities and comparable research and development areas. Referenced SEMI Standards None.

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