D04500 - SEMI D45 - 平面顯示器彩色濾光片所使用，含高阻值之樹脂型黑色矩陣電阻的量測方法 StdDcs-Superseded • assess the agreement between

• assess the agreement between the measured

1  This Specification is specifically directed to silicon homoepitaxial deposits on homogeneous silicon substrates only

The scope of this Document also addresses the calibration method to be used

Shrinkage and advanced integration of semiconductor components demand lower metal contamination levels in component-fabrication processes and in base silicon wafer substrates

24-1116 (Reapproved 0124)

D04500 - SEMI D45 - 平面顯示器彩色濾光片所使用，含高阻值之樹脂型黑色矩陣電阻的量測方法 StdDcs-Superseded • assess the agreement between1. 1 BM 2. 1BM This standard was technically approved by the global Flat Panel Display Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on May 16, 2006. It was available at www. semi. org in June 2006. This standard establishes practices for measuring characteristics of resin Black Matrix (BM) with high resistance for FPD color filter. Referenced SEMI Standards SEMI D13 Terminology for FPD Color Filter