M07500 - SEMI M75 - Specification for Polished Monocrystalline Gallium Antimonide Wafers Revision:SEMI M75-0309 - Superseded if the end-user wishes and

if the end-user wishes and performance is demonstrated for the analyte of interest

1-96E (editorial revision)

SEMI MF1389-00 (first SEMI publication)

Data Value Types

This Test Method is suitable for both contact and contactless gaging equipment

M07500 - SEMI M75 - Specification for Polished Monocrystalline Gallium Antimonide Wafers Revision:SEMI M75-0309 - Superseded if the end-user wishes andThe purpose of this Document is to define standard descriptions for the parameters to be specified in the procurement and supply of round wafers of gallium antimonide (GaSb) monocrystalline material. This Specification covers the information required for the procurement of round, flatted GaSb wafers and the standard dimensional and orientation conventions for the supply of such wafers. Referenced SEMI StandardsSEMI MF26 Test Method for Determining the