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G02400 - SEMI G24 - パッケージ・リード間の容量および付加容量の測定のための試験方法 StdPbc-0723 This Test Method is applicable

SKU: 87101713303
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Description

This Test Method is applicable to slices of silicon with resistivity higher than 3 ·cm for p-type and higher than 1 ·cm for n-type

nor does it make recommendations regarding decisions about the process cycle or equipment used to produce the thin film that was measured

TSVを対象とする。

SEMI E109-0305 (technical revision)

SEMI D42-0308 (technical revision)

G02400 - SEMI G24 - パッケージ・リード間の容量および付加容量の測定のための試験方法 StdPbc-0723 This Test Method is applicableglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org19841989 : Referenced SEMI Standards None.

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