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G03800 - SEMI G38 - 静止空気および強制風冷によるICパッケージのジャンクション部周囲間の熱抵抗の測定法 StdVol-Gases Although it is possible to

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Description

Although it is possible to use this test mask to evaluate transcription of defects etc

which is determined by the amount of moisture taken up by the system and subsequently released in any exposure after receipt

but these are outside the scope of this Test Method

and Korean

This Document specifies the protocol and services that compliant intelligent devices must support to exchange information over this semiconductor equipment sensor/actuator network

G03800 - SEMI G38 - 静止空気および強制風冷によるICパッケージのジャンクション部周囲間の熱抵抗の測定法 StdVol-Gases Although it is possible toglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1987200411 : IC Referenced SEMI Standards SEMI G32 Guideline for Unencapsulated Thermal Test Chip SEMI G42 Specification for Thermal Test Board Standardization for Measuring Junction to Ambient Thermal Resistance of Semiconductor Packages

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