E12400 - SEMI E124 - Guide for Definition and Calculation of Overall Factory Efficiency (OFE) and Other Associated Factory-Level Productivity Metrics Revision:SEMI E124-1107 - Superseded 9998% Quality

9998% Quality

high- and low-impedance load

This Standard is applicable only to wafers that are 450 mm in diameter and to the interface between cluster tool modules

This Test Method describes a procedure to determine the electrostatic properties of interleaf materials in film or sheet form by measuring the magnitude and polarity of an induced charge and the time required for complete dissipation of the charge

Because the profile which X

E12400 - SEMI E124 - Guide for Definition and Calculation of Overall Factory Efficiency (OFE) and Other Associated Factory-Level Productivity Metrics Revision:SEMI E124-1107 - Superseded 9998% QualityNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This Guide describes metrics that show how well a factory is operating compared to how well it could be operating (for the given product mix). These metrics can be used for tracking factory performance (in value added